NICKEL-CHROMIUM RESISTOR FAILURE MODES AND THEIR IDENTIFICATION

被引：10

作者：

KEENAN, WF ^{[1
]}

RUNYAN, WR ^{[1
]}

机构：

[1] TEXAS INSTR INC,DALLAS,TX 75222

来源：

MICROELECTRONICS AND RELIABILITY | 1973年 / 12卷 / 02期

关键词：

D O I：

10.1016/0026-2714(73)90457-5

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：125 / &

共 31 条

[1] VACUUM-DEPOSITED FILMS OF NICKEL-CHROMIUM ALLOY [J].

ALDERSON, RH ;

ASHWORTH, F .

BRITISH JOURNAL OF APPLIED PHYSICS, 1957, 8 (05) :205-210

[2]

BOHRER JJ, PHYSICS FAILURE ELEC, V2

[3]

CHAPMAN RM, 1953, VACUUM, P213

[4] TRANSIENT OXIDATION OF FE-CR AND NI-CR ALLOYS [J].

CHATTOPADHYAY, B ;

WOOD, GC .

[5]

CHURCH HF, PHYSICS FAILURE ELEC, V4

[6]

CROSSLAND WA, PHYSICS FAILURE ELEC, V5

GULBRANSEN, EA ;

ANDREW, KF .

[8] SOME APPLICATIONS OF TRIODE SPUTTERING TO INTEGRATED CIRCUITS [J].

HALL, JH .

[9]

HANFIELD HG, 1964, THIN FILM CIRCUITS 2, V3

[10]

HUIJER P, 1962, PHILIPS TECH REV, V24, P144