DEFLECTION AND INTERFERENCE FRINGES OF X-RAY WAVE FIELDS

被引：27

作者：

LEHMANN, K ^{[1
]}

BORRMANN, G ^{[1
]}

机构：

[1] Max Planck Gesell, Fritz Haber Inst, Berlin, GERMANY

来源：

ZEITSCHRIFT FUR KRISTALLOGRAPHIE KRISTALLGEOMETRIE KRISTALLPHYSIK KRISTALLCHEMIE | 1967年 / 125卷 / 1-6期

关键词：

D O I：

10.1524/zkri.1967.125.125.234

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：234 / +

页数：1

共 11 条

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[2]

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[3]

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[4]

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WEISS, RJ .

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[6]

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[7]

GOTTLICHER S, 1959, Z ELEKTROCHEM, V63, P891

[8] A THEORETICAL CALCULATION OF X-RAY ABSORPTION CROSS SECTIONS [J].

GUTTMANN, AJ ;

WAGENFELD, H .

ACTA CRYSTALLOGRAPHICA, 1967, 22 :334-+

[9] ABSOLUTE MEASUREMENT OF STRUCTURE FACTORS OF SI SINGLE CRYSTAL BY MEANS OF X-RAY PENDELLOSUNG FRINGES [J].

HATTORI, H ;

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[10]

VONLAUE M, 1960, ROTGENSTRAHLINTERFER

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