PHOTOREDUCTION OF HEXAVALENT CHROMIUM DURING X-RAY PHOTOELECTRON-SPECTROSCOPY ANALYSIS OF ELECTROCHEMICAL AND THERMAL FILMS

被引：121

作者：

HALADA, GP

CLAYTON, CR

机构：

[1] Department of Materials Science and Engineering, State University of New York at Stony Brook, Stony Brook

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1991年 / 138卷 / 10期

关键词：

D O I：

10.1149/1.2085340

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

Cr spectra obtained by x-ray photoelectron spectroscopy (XPS) of corrosion product layers is critically examined for evidence of photoreduction of hexavalent species. Tetravalent and trivalent decomposition products are identified, and methods of curve fitting and analysis are discussed. Disagreement between x-ray absorption near end structure and XPS data, and between thermodynamic analysis and XPS data lead to the acceptance of a model for photoreduction of Cr6+ based primarily upon core photoemission.

引用

页码：2921 / 2927

页数：7

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