MINIATURE HALL SENSOR FABRICATED WITH MASKLESS ION-IMPLANTATION

[1] DIRECT COMPARISON OF THE ELECTRON-TEMPERATURE MODEL WITH THE PARTICLE-MESH (MONTE-CARLO) MODEL FOR THE GAAS-MESFET [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1982, 29 (12) : 1942 - 1943

[2] MICRON-SIZE HALL PROBE FOR PRECISION MAGNETIC-FIELD MAPPING [J]. JOURNAL OF APPLIED PHYSICS, 1979, 50 (04) : 2945 - 2947

[3] MICROPROBE FOR MEASURING MAGNETIC FIELDS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1962, 33 (02) : 201 - &

[4] ANALYTICAL MODELS OF GAAS-FETS [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1985, 32 (01) : 70 - 72

[5] MICROMINIATURE HALL PROBES FOR USE IN LIQUID HELIUM [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1968, 39 (04) : 570 - &

[6] DETECTION OF CYLINDRICAL MAGNETIC DOMAINS [J]. JOURNAL OF APPLIED PHYSICS, 1971, 42 (04) : 1251 - &

[7] DIRECT MEASUREMENT OF STRAY MAGNETIC-FIELD DISTRIBUTIONS FROM A MAGNETIC-BUBBLE DOMAIN IN YTTRIUM ORTHOFERRITE WITH A MICRO HALL ELEMENT [J]. PROCEEDINGS OF THE IEEE, 1976, 64 (11) : 1643 - 1644

[8] SUGIYAMA Y, 1985, 1985 P INT C SOL STA, P308

[9] SUGIYAMA Y, 1986, 6TH P SENS S, P55

[10] WEISS H, 1969, STRUCTURE APPLICATIO

[1] DIRECT COMPARISON OF THE ELECTRON-TEMPERATURE MODEL WITH THE PARTICLE-MESH (MONTE-CARLO) MODEL FOR THE GAAS-MESFET [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1982, 29 (12) : 1942 - 1943

[2] MICRON-SIZE HALL PROBE FOR PRECISION MAGNETIC-FIELD MAPPING [J]. JOURNAL OF APPLIED PHYSICS, 1979, 50 (04) : 2945 - 2947

[3] MICROPROBE FOR MEASURING MAGNETIC FIELDS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1962, 33 (02) : 201 - &

[4] ANALYTICAL MODELS OF GAAS-FETS [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1985, 32 (01) : 70 - 72

[5] MICROMINIATURE HALL PROBES FOR USE IN LIQUID HELIUM [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1968, 39 (04) : 570 - &

[6] DETECTION OF CYLINDRICAL MAGNETIC DOMAINS [J]. JOURNAL OF APPLIED PHYSICS, 1971, 42 (04) : 1251 - &

[7] DIRECT MEASUREMENT OF STRAY MAGNETIC-FIELD DISTRIBUTIONS FROM A MAGNETIC-BUBBLE DOMAIN IN YTTRIUM ORTHOFERRITE WITH A MICRO HALL ELEMENT [J]. PROCEEDINGS OF THE IEEE, 1976, 64 (11) : 1643 - 1644

[8] SUGIYAMA Y, 1985, 1985 P INT C SOL STA, P308

[9] SUGIYAMA Y, 1986, 6TH P SENS S, P55

[10] WEISS H, 1969, STRUCTURE APPLICATIO