ISOTOPIC FRACTIONATION IN SECONDARY IONIZATION MASS-SPECTROMETRY

被引:23
作者
LYON, IC
SAXTON, JM
TURNER, G
机构
[1] Department of Geology, The University of Manchester, Manchester
[2] Department of Geology and Geophysics, University of Edinburgh, Edinburgh
关键词
D O I
10.1002/rcm.1290081009
中图分类号
Q5 [生物化学];
学科分类号
071010 ; 081704 ;
摘要
We have studied isotopic fractionation effects which occur during the analysis of oxygen isotope ratios by secondary ionization mass spectrometry. Variable instrumental isotopic fractionation has been well documented in the past as making reliable ion microprobe analyses of oxygen isotopes elusive. We report here techniques for minimizing these effects by careful optimization of an Isolab 54 ion microprobe and a method of integrating the secondary-ion beam to eliminate a major source of fractionation caused by unequal focusing of isotopes on the source slit of the mass spectrometer. A further improvement has been the installation of new ion detectors for measuring O-18- and O-17- secondary ion beams in which the ions strike a conversion dynode (Conversion dynode system-CDS) to release electrons into a channeltron. The CDS detectors have a uniform, high and stable gain which, coupled with the beam integration techniques referred to above, yield reproducible oxygen isotope ratios on both conducting and insulating mineral standards (less-than-or-equal-to 1.2 parts per thousand on O-18/O-16 during a day and < 2 parts per thousand over periods of days and weeks).
引用
收藏
页码:837 / 843
页数:7
相关论文
共 14 条
[1]  
BENNINGHOVEN A, 1987, SECONDARY ION MASS S, V86, P211
[2]  
BENNINGHOVEN A, 1987, SECONDARY ION MASS S, V86, pCH2
[3]   THE LAMONT-DOHERTY-GEOLOGICAL-OBSERVATORY ISOLAB-54 ISOTOPE RATIO MASS-SPECTROMETER [J].
ENGLAND, JG ;
ZINDLER, A ;
REISBERG, LC ;
RUBENSTONE, JL ;
SALTERS, V ;
MARCANTONIO, F ;
BOURDON, B ;
BRUECKNER, H ;
TURNER, PJ ;
WEAVER, S ;
READ, P .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1992, 121 (03) :201-240
[4]  
ENGSTROM EU, 1987, MIKROCHIM ACTA, V1, P387
[5]  
GILLETTI BJ, 1989, USGS B, V1890, P129
[6]   VELOCITY-DEPENDENT ISOTOPE FRACTIONATION IN SECONDARY-ION EMISSION [J].
GNASER, H ;
HUTCHEON, ID .
PHYSICAL REVIEW B, 1987, 35 (02) :877-879
[7]   MICROANALYSIS OF OXYGEN ISOTOPES IN INSULATORS BY SECONDARY ION MASS-SPECTROMETRY [J].
HERVIG, RL ;
WILLIAMS, P ;
THOMAS, RM ;
SCHAUER, SN ;
STEELE, IM .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1992, 120 (1-2) :45-63
[8]  
HERVIG RL, 1989, NEW FRONTIERS STABLE, P137
[9]   VARIATIONS OF ISOTOPIC DISCRIMINATION IN SECONDARY ION MASS-SPECTROMETRY [J].
JULL, AJT .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1982, 41 (03) :135-141
[10]  
LYON IC, UNPUB