NUCLEAR-RESONANCE EFFECTS IN THE ANALYSIS OF PROTON BACKSCATTERING FROM CARBON AND SILICON FILMS

被引:9
作者
LIU, JG
XIE, TB
FISCHBECK, HJ
机构
[1] LINFIELD RES INST,MCMINNVILLE,OR 97128
[2] UNIV OKLAHOMA,NORMAN,OK 73019
关键词
D O I
10.1016/0168-583X(93)95390-Q
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The use of elastic resonance backscattering of protons in the analysis of thin films is sometimes an advantage. It allows precise and accurate thickness determination even when the energy calibration of the system is marginal. The availability of reliable values for the scattering cross section in the region of the resonance is essential. We have remeasured the elastic scattering cross section of protons on C and Si in the energy region between 450 and 2200 keV at a laboratory angle of 155-degrees. Our data are compared with earlier measurements. The usefulness of the incorporation of resonance scattering in the spectrum analysis is demonstrated.
引用
收藏
页码:468 / 470
页数:3
相关论文
共 7 条
[1]   EXCITED STATES IN P29 FROM SCATTERING OF PROTONS BY SI28 [J].
BELOTE, TA ;
RISSER, JR ;
KASHY, E .
PHYSICAL REVIEW, 1961, 122 (03) :920-&
[2]   ELASTICALLY SCATTERED PROTONS FROM CARBON [J].
GOLDHABER, G ;
WILLIAMSON, RM .
PHYSICAL REVIEW, 1951, 82 (04) :495-498
[3]   CLASSIFICATION OF N-13 LEVELS BY PARTIAL WAVE ANALYSIS OF PROTON SCATTERING FROM C-12 [J].
JACKSON, HL ;
GALONSKY, AI .
PHYSICAL REVIEW, 1951, 84 (03) :401-408
[4]   RESONANCE EFFECTS IN THIN-FILM PROTON BACKSCATTERING SPECTROMETRY [J].
LIU, JG ;
XIE, TB ;
FISCHBECK, HJ .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1991, 56-7 :744-748
[6]   PROTON ELASTIC SCATTERING CROSS SECTIONS OF SI, CL, K, SC, TI, AND MN [J].
RUBIN, S ;
BAILEY, LE ;
PASSELL, TO .
PHYSICAL REVIEW, 1959, 114 (04) :1110-1114
[7]   LEVELS OF P-29 FROM SI-28(P,P)SI-28 AND SI-28(P,P')SI-28 [J].
VORONA, J ;
OLNESS, JW ;
HAEBERLI, W ;
LEWIS, HW .
PHYSICAL REVIEW, 1959, 116 (06) :1563-1571