CURRENT-CONTROLLED NEGATIVE-RESISTANCE BEHAVIOR AND MEMORY SWITCHING IN BULK AS-TE-SE GLASSES

被引:17
作者
CHATTERJEE, R
ASOKAN, S
TITUS, SSK
机构
[1] Instrumentation and Services Unit, Indian Institute of Science, Bangalore
关键词
Semiconducting glass;
D O I
10.1088/0022-3727/27/12/025
中图分类号
O59 [应用物理学];
学科分类号
摘要
The current-voltage characteristics and electrical switching behaviour of bulk AsxTe100-x-ySey glasses have been investigated over a wide composition range (25 less-than-or-equal-to x less-than-or-equal-to 60; 10 less-than-or-equal-to y less-than-or-equal-to 25). Most of the glasses studied have been found to exhibit a current-controlled negative-resistance behaviour with memory. A sharp switching is observed in the glass of composition As50Te30Se20. A strong dependence of the switching fields on composition, which resembles the variation of crystallization temperatures with x, has been noticed. Further, a current pulse of 100 mA amplitude and 10 mus duration is found to re-set the memory-switched As-Te-Se glasses to the original high-resistance state. The sample can be made to switch again, with +/-2% variation in the switching fields. This indicates the possible application of these materials in 'read mostly' memories.
引用
收藏
页码:2624 / 2627
页数:4
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