FAR INFRARED CYCLOTRON EMISSION IN SEMICONDUCTORS

被引:18
作者
GORNIK, E
机构
[1] BELL TEL LABS INC,MURRAY HILL,NJ 07974
[2] LUDWIG BOLTZMANN INST FESTKORPERPHYS,WIEN,AUSTRIA
关键词
D O I
10.1016/0304-8853(79)90229-4
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Electrically excited cyclotron emission has been observed in several semiconductors (InSb, GaAs, CdHgTe and Si- inversion layers). Maximum output powers of 1 μW, a spectral linewidth of ≈ 2 cm-1 and a tunability from 20 cm-1 to 160 cm-1 are achieved with n-InSb and n-GaAs with electric fields up to 100 V/cm. A detailed study of the energy relaxation in n-InSb has shown that the total intensities observed are well described with hot electron distribution functions. The energy relaxation is governed by an interplay of electron-electron scattering and optical phonon emission. Electron-electron scattering is also responsible for the electronic lifetime in the N = 1 Landau level, giving values of ≈ 10-10 s for excited densities of 1013 cm-3. © 1979.
引用
收藏
页码:39 / 46
页数:8
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