ION-IMPLANTATION-INDUCED PHASE-SEPARATION AND CRYSTALLIZATION IN LITHIA-SILICA GLASSES

Crystallization of annealed Li//2O:2 SiO//2 glasses implanted with inert ions and fused SiO//2 glass implanted with Li ions was monitored using infrared reflection spectroscopy. Elastic recoil detection analysis was used to study changes in the Li and H concentration induced in these glasses by implantation and annealing. Implantation of Li//2O:2 SiO//2 with inert ions results in Li depletion, accompanied by H indiffusion, in the implanted region. For Li-implanted SiO//2, crystallization of alpha -quartz is accompanied by appreciable Li diffusion to the surface and attendant H migration to the Li-depleted region. The crystallization mechanisms are discussed in terms of separation in the lithia-silica system.