NEUTRON-DIFFRACTION STUDY OF THE ELECTROCHEMICAL PASSIVATION OF NICKEL POWDER

被引：7

作者：

BOMCHIL, G ^{[1
]}

RIEKEL, C ^{[1
]}

机构：

[1] INST MAX VON LAUE PAUL LANGEVIN,F-38042 GRENOBLE,FRANCE

来源：

JOURNAL OF ELECTROANALYTICAL CHEMISTRY | 1979年 / 101卷 / 01期

关键词：

D O I：

10.1016/S0022-0728(79)80088-1

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

[No abstract available]

引用

页码：133 / 135

页数：3

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[2] POSITION-SENSITIVE DETECTORS (PSD) FOR NEUTRON-DIFFRACTION [J].

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[3] AN ELLIPSOMETRIC DETERMINATION OF MECHANISM OF PASSIVITY OF NICKEL [J].

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RAO, B .

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[4] ELLIPSOMETRIC DETERMINATION OF FILM THICKNESS AND CONDUCTIVITY DURING PASSIVATION PROCESS ON NICKEL [J].

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BOCKRIS, JOM .

JOURNAL OF CHEMICAL PHYSICS, 1965, 42 (06) :2246-&

[5] NEUTRON-DIFFRACTION STUDY ON INTERCALATION OF AMMONIA INTO TANTALUM DISULFIDE [J].

RIEKEL, C ;

SCHOLLHORN, R .

MATERIALS RESEARCH BULLETIN, 1976, 11 (04) :369-376

[6]

RIEKEL C, J CHEM PHYS

[7]

RIEKEL C, J SOLID STATE CHEM

[8]

WHITE JW, 1977, DYNAMICS SOLIDS LIQU

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