QUANTITATIVE AES ANALYSIS OF CU-NI SYSTEMS USING M1 VV TRANSITIONS (90-110 EV) - COMPUTER-SIMULATION

被引：12

作者：

GOTO, K ^{[1
]}

ISHIKAWA, K ^{[1
]}

WOLFE, RG ^{[1
]}

GRANT, JT ^{[1
]}

机构：

[1] UNIVERSAL ENERGY SYST INC,DAYTON,OH 45432

来源：

APPLIED SURFACE SCIENCE | 1979年 / 3卷 / 02期

关键词：

D O I：

10.1016/0378-5963(79)90020-5

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

M1VV Auger spectra (90-110 eV) from Cu-Ni films have been simulated with a mini-computer for several alloy concentrations using Auger spectra from pure Cu and pure Ni foils. Resulting spectra are compared with those obtained from Cu-Ni films grown by co-evaporating Cu and Ni onto substrates held near liquid nitrogen temperature, verifying that films grown in this manner have a surface composition identical with the bulk. © 1979.

引用

页码：211 / 216

页数：6

共 8 条

[1]

GOTO K, 1977, 7TH P INT VAC C 3RD, P1493

[2]

GOTO K, 1978, J VAC SCI TECHNOL, V15, P1695

[3] DETERMINATION OF SURFACE COMPOSITION OF CU-NI ALLOYS FOR CLEAN AND ADSORBATE-COVERED SURFACES [J].