DEVICE FOR MEASUREMENT OF THE ELECTRICAL PROPERTIES OF BI2SE3 AT ELEVATED TEMPERATURES

被引：11

作者：

SMITH, MJ

KIRK, ES

SPENCER, CW

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1960年 / 31卷 / 08期

关键词：

D O I：

10.1063/1.1735877

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

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页码：1504 / 1505

页数：2

相关论文

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[3] APPARATUS FOR MEASURING RESISTIVITY AND HALL COEFFICIENT OF SEMICONDUCTORS
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[4] STABILITIES OF THE GASEOUS MOLECULES, BISE, BITE, AND SBTE
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SPENCER, CW
[J]. JOURNAL OF CHEMICAL PHYSICS, 1960, 32 (03) : 943 - 944
[5] SEYBOLT AU, 1953, EXPT METALLURGY, P77