ELIMINATION OF THE SKIN EFFECT ERROR IN HEAVY-CURRENT SHUNTS

被引：14

作者：

MALEWSKI, R

NGUYEN, CT

FESER, K

HYLTENCAVALLIUS, N

机构：

[1] HAEFELY & CO LTD,BASEL,SWITZERLAND

[2] CEPEL,RIO DE JANEIRO,BRAZIL

来源：

IEEE TRANSACTIONS ON POWER APPARATUS AND SYSTEMS | 1981年 / 100卷 / 03期

关键词：

D O I：

10.1109/TPAS.1981.316606

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1333 / 1340

页数：8

共 12 条

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[6] MICRO-OHM SHUNTS FOR PRECISE RECORDING OF SHORT-CIRCUIT CURRENTS [J].

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IEEE TRANSACTIONS ON POWER APPARATUS AND SYSTEMS, 1977, 96 (02) :579-585

[7]

Moller K., 1969, Elektrotechnische Zeitschrift ETZ A, V90, P256

[8] SHUNTS AND INDUCTORS FOR SURGE-CURRENT MEASUREMENTS [J].

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[9]

ROGERS EJ, 1974, IEEE PES M

[10] LOW-RESISTANCE SHUNTS FOR IMPULSE CURRENTS [J].

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