INCIDENT-BEAM IONIZATION-CHAMBER AND CHARGE INTEGRATION SYSTEM FOR STABILIZATION OF X-RAY-DIFFRACTION EXPERIMENTS

被引:3
作者
HENDRICKS, RW
DELORENZ.JT
GLASS, FM
ZEDLER, RE
机构
[1] OAK RIDGE NATL LAB, MET & CERAMICS DIV, OAK RIDGE, TN 37830 USA
[2] OAK RIDGE NATL LAB, INSTR & CONTROLS DIV, OAK RIDGE, TN 37830 USA
来源
JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1973年 / 6卷 / APR1期
关键词
D O I
10.1107/S0021889873008289
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
引用
收藏
页码:129 / 132
页数:4
相关论文
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PHYSICAL REVIEW, 1963, 132 (02) :728-&
[2]   A NEW APPROACH TO DIRECT CURRENT INTEGRATION [J].
GLASS, FM ;
COURTNEY, CC ;
KENNEDY, EJ ;
WILSON, HN .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1967, NS14 (01) :143-&
[3]  
GLASS FM, 1973, ORNLTM3906 OAK RIDG
[4]  
KRATKY O, 1954, Z ELEKTROCHEM, V58, P49
[5]  
KRATKY O, 1967, SMALL ANGLE XRAY SCA