NONDIFFRACTION SPECTROSCOPIC PROBES OF THE STRUCTURE OF AMORPHOUS SOLIDS

被引：5

作者：

ELLIOTT, SR

机构：

[1] Department of Physical Chemistry, University of Cambridge, Cambridge, Lensfield Road

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 1990年 / 123卷 / 1-3期

关键词：

D O I：

10.1016/0022-3093(90)90780-P

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The use of non-diffraction probes in investigating the structure of amorphous materials is reviewed. In particular, X-ray absorption spectroscopy (XAS), and its variant extended X-ray absorption fine structure (EXAFS), and nuclear magnetic resonance (NMR) are discussed, with emphasis being laid on recent developments in experimental techniques. Examples are given of the use of these structural probes to a variety of amorphous materials, including oxide and chalcogenide glasses and amorphous silicon thin films. © 1990.

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页码：149 / 164

页数：16

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