SENSITIVITY OF X-RAY-DIFFRACTION METHODS FOR THE MEASUREMENT OF EXTENDED DEFORMATION FIELDS

被引：1

作者：

DIETRICH, B

机构：

[1] Sektion Physik Der, Friedrich-Schiller-Universitat Jena

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1979年 / 56卷 / 01期

关键词：

D O I：

10.1002/pssa.2210560121

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The sensitivity of methods for measuring deformation, constant and position dependent deformation gradients is calculated on the basis of Kato's theory. By choosing suitable criteria of comparison it becomes evident that all X‐ray diffraction methods essentially have an equivalent sensitivity, but they differ in their possibilities for use under special conditions. Copyright © 1979 WILEY‐VCH Verlag GmbH & Co. KGaA

引用

页码：199 / 206

页数：8

共 16 条

[1] DYNAMICAL THEORY OF X-RAY DIFFRACTION IN CRYSTALS WITH DEFECTS [J].