AN EXPERT SYSTEM FOR THE STRUCTURAL CHARACTERIZATION OF KAOLINITES

Until recently, the determination of the defect structures of kaolinites has been obtained in one of two ways: 1) measurement of the Hinckley index, or 2) by comparing calculated X-ray diffraction patterns based on a model of the defect structure with experimental diffraction profiles. Another approach is proposed: an expert system which will accurately describe the defect structure of kaolinites based on a few measurements taken from a normal powder diffraction profile. This system has been verified for nine kaolinite samples for which the defect structure was previously determined by comparison of calculated and observed diffraction profiles. The expert system reproduced the correct defect structure for each of the samples. -from Authors