ORIGIN OF LOW-VOLTAGE STRUCTURE AND ASYMMETRY IN I-V CHARACTERISTICS OF MULTIPLY-CONNECTED SUPERCONDUCTING JUNCTIONS

被引：23

作者：

CLARKE, J

FULTON, TA

机构：

[1] Inorganic Materials Division, Physics Department, University of California, Berkeley

[2] Bell Telephone Laboratories, Incorporated, Murray Hill

来源：

JOURNAL OF APPLIED PHYSICS | 1969年 / 40卷 / 11期

关键词：

D O I：

10.1063/1.1657217

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A self-magnetic field effect is shown to be responsible for much of the low-voltage structure and for asymmetries observed in the I-V curves of superconducting niobium-solder junctions (Slugs). Similar effects are to be expected in other multiply-connected junctions. © 1969 The American Institute of Physics.

引用

页码：4470 / &

共 18 条

[1] A SUPERCONDUCTING GALVANOMETER EMPLOYING JOSEPHSON TUNNELLING [J].