DIRECT OPTICAL MEASUREMENT OF SURFACE DIELECTRIC RESPONSES - INTERRUPTED GROWTH ON (001) GAAS

被引:102
作者
ASPNES, DE [1 ]
CHANG, YC [1 ]
STUDNA, AA [1 ]
FLOREZ, LT [1 ]
FARRELL, HH [1 ]
HARBISON, JP [1 ]
机构
[1] UNIV ILLINOIS,URBANA,IL 61801
关键词
D O I
10.1103/PhysRevLett.64.192
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Anisotropies of the visible-near-ultraviolet dielectric responses of various (001) GaAs molecular-beam-epitaxy growth surfaces are measured at temperature using a new optical double-modulation technique and a low-strain fused-quartz window. Tight-binding calculations identify structure at 1.8 eV with Ga dimers and at 2.6 and 4.1 eV with As dimers. Transient behavior on interruption of As flux is substantially altered by misorientation, suggesting substantially different terrace properties for vicinally cut surfaces. © 1990 The American Physical Society.
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页码:192 / 195
页数:4
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