DETERMINATION OF BOND LENGTHS FROM EXAFS WITH HIGH-RESOLUTION

被引：15

作者：

RABE, P

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 1978年 / 17卷

关键词：

PHYSICAL CHEMISTRY;

D O I：

10.7567/JJAPS.17S2.22

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The investigation of EXAFS has grown to an important tool for the analysis of the local geometrical structure in complex systems. The development of the method has been stimulated by the availability of high intensity X-ray sources. Improved techniques of data evaluation are reviewed which permit accuracies for bond length better than 0. 001 mm.

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页码：22 / 29

页数：8

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