OPTICAL 3-DIMENSIONAL SENSING BY PHASE MEASURING PROFILOMETRY

被引：149

作者：

HALIOUA, M

LIU, HC

机构：

来源：

OPTICS AND LASERS IN ENGINEERING | 1989年 / 11卷 / 03期

关键词：

D O I：

10.1016/0143-8166(89)90031-6

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：185 / 215

页数：31

共 53 条

[1]

AGIN GJ, 1982, P SOC PHOTO-OPT INST, V360, P326

[2]

ALEXANDER BF, 1985, 5TH INT C ROB VIS SE, P211

[3]

ALTSCHULER M, 1979, SPIE, V182, P187

[4] LASER ELECTROOPTIC SYSTEM FOR RAPID 3-DIMENSIONAL (3-D) TOPOGRAPHIC MAPPING OF SURFACES [J].

ALTSCHULER, MD ;

ALTSCHULER, BR ;

TABOADA, J .

OPTICAL ENGINEERING, 1981, 20 (06) :953-961

[5]

BAUMANN JU, 1983, SPIE, V1030

[6] MOIRE TOPOGRAPHY, SAMPLING THEORY, AND CHARGED-COUPLED DEVICES [J].

BELL, BW ;

KOLIOPOULOS, CL .

OPTICS LETTERS, 1984, 9 (05) :171-173

[7] CHARACTERIZATION AND CONTROL OF 3-DIMENSIONAL OBJECTS USING FRINGE PROJECTION TECHNIQUES [J].

BENOIT, P ;

MATHIEU, E ;

HORMIERE, J ;

THOMAS, A .

NOUVELLE REVUE D OPTIQUE, 1975, 6 (02) :67-86

[8] CONTROL OF LOW INERTIA GALVANOMETERS FOR HIGH-PRECISION LASER SCANNING SYSTEMS [J].

BLAIS, F .

OPTICAL ENGINEERING, 1988, 27 (02) :104-110

[9] DIGITAL WAVEFRONT MEASURING INTERFEROMETER FOR TESTING OPTICAL SURFACES AND LENSES [J].

BRUNING, JH ;

HERRIOTT, DR ;

GALLAGHER, JE ;

ROSENFELD, DP ;

WHITE, AD ;

BRANGACCIO, DJ .

APPLIED OPTICS, 1974, 13 (11) :2693-2703

[10]

Cielo P., 1988, OPTICAL TECHNIQUES I

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