DISLOCATION SUB-BOUNDARY ARRAYS IN ORIENTED THIN-FILM BICRYSTALS OF GOLD

A technique for producing any type of planar dislocation sub-boundary in thin-film bierystal specimens of gold under controlled conditions is described. Single crystal thin films of the desired orientations are first grown epitaxially on appropriate substrates from the vapour phase. Two films, while still on their substrates, are then welded together face-to-face at any desired mis-orientation to produce a thin-film bierystal containing a planar dislocation array at the welded interface. The substrates are then dissolved away to allow examination of the sub-boundary at normal incidence by transmission electron microscopy. The technique is applied to the study of pure twist sub-boundaries on (001) and (111) planes in gold. Features of the structures of these boundaries are described. Further possible applications are discussed. © 1969 Taylor & Francis Group, LLC.