SQUEEZED PHOTON-NUMBER NOISE AND SUB-POISSONIAN ELECTRICAL PARTITION NOISE IN A SEMICONDUCTOR-LASER

被引：164

作者：

RICHARDSON, WH ^{[1
]}

MACHIDA, S ^{[1
]}

YAMAMOTO, Y ^{[1
]}

机构：

[1] NIPPON TELEGRAPH & TEL PUBL CORP, MUSASHINO ELECT COMMUN LAB, BASIC RES LABS, MUSASHINO, TOKYO 180, JAPAN

来源：

PHYSICAL REVIEW LETTERS | 1991年 / 66卷 / 22期

关键词：

D O I：

10.1103/PhysRevLett.66.2867

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Amplitude noise on the light from a semiconductor laser produced a photocurrent fluctuation spectrum that was a maximum of 85% (-8.3 dB) below the shot-noise limit. Squeezing in semiconductor lasers is not limited by the overall quantum, or current transfer, efficiency from the laser injection current to the detector photocurrent. Current leakage away from the lasing junction does not introduce Poissonian partition noise.

引用

页码：2867 / 2870

页数：4

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