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BREAKDOWN OF THIN-FILM EMITTERS
被引:8
作者
:
AHMED, H
论文数:
0
引用数:
0
h-index:
0
AHMED, H
机构
:
来源
:
JOURNAL OF APPLIED PHYSICS
|
1972年
/ 43卷
/ 01期
关键词
:
D O I
:
10.1063/1.1660820
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:242 / &
相关论文
共 5 条
[1]
AHMED H, 1971, 29 P ANN M EMSA BOST
[2]
A NEW HIGH RESOLUTION REFLECTION SCANNING ELECTRON MICROSCOPE
BROERS, AN
论文数:
0
引用数:
0
h-index:
0
BROERS, AN
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1969,
40
(08)
: 1040
-
&
[3]
STRUCTURAL EFFECTS IN THIN-FILM SANDWICH EMITTERS
HARRIS, LA
论文数:
0
引用数:
0
h-index:
0
HARRIS, LA
[J].
JOURNAL OF APPLIED PHYSICS,
1964,
35
(02)
: 268
-
&
[4]
ELECTRON EMISSION ELECTROLUMINESCENCE AND VOLTAGE-CONTROLLED NEGATIVE RESISTANCE IN AL-AL2O3-AU DIODES
HICKMOTT, TW
论文数:
0
引用数:
0
h-index:
0
HICKMOTT, TW
[J].
JOURNAL OF APPLIED PHYSICS,
1965,
36
(06)
: 1885
-
&
[5]
MEAD CA, 1960, P IRE, V48, P1478
←
1
→
共 5 条
[1]
AHMED H, 1971, 29 P ANN M EMSA BOST
[2]
A NEW HIGH RESOLUTION REFLECTION SCANNING ELECTRON MICROSCOPE
BROERS, AN
论文数:
0
引用数:
0
h-index:
0
BROERS, AN
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1969,
40
(08)
: 1040
-
&
[3]
STRUCTURAL EFFECTS IN THIN-FILM SANDWICH EMITTERS
HARRIS, LA
论文数:
0
引用数:
0
h-index:
0
HARRIS, LA
[J].
JOURNAL OF APPLIED PHYSICS,
1964,
35
(02)
: 268
-
&
[4]
ELECTRON EMISSION ELECTROLUMINESCENCE AND VOLTAGE-CONTROLLED NEGATIVE RESISTANCE IN AL-AL2O3-AU DIODES
HICKMOTT, TW
论文数:
0
引用数:
0
h-index:
0
HICKMOTT, TW
[J].
JOURNAL OF APPLIED PHYSICS,
1965,
36
(06)
: 1885
-
&
[5]
MEAD CA, 1960, P IRE, V48, P1478
←
1
→