CRITICAL THICKNESSES IN SUPERCONDUCTING THIN-FILMS

被引:50
作者
DOLAN, GJ
SILCOX, J
机构
[1] CORNELL UNIV, SCH APPL & ENGN PHYS, ITHACA, NY 14850 USA
[2] CORNELL UNIV, LAB ATOM & SOLID STATE PHYS, ITHACA, NY 14850 USA
关键词
D O I
10.1103/PhysRevLett.30.603
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:603 / 606
页数:4
相关论文
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