DOUBLE-TIP SCANNING TUNNELING MICROSCOPE FOR SURFACE-ANALYSIS

被引:39
作者
NIU, Q
CHANG, MC
SHIH, CK
机构
[1] Department of Physics, University of Texas, Austin
来源
PHYSICAL REVIEW B | 1995年 / 51卷 / 08期
关键词
D O I
10.1103/PhysRevB.51.5502
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We explore the possibility of using a double-tip scanning tunneling microscope to probe the single-electron Green function of a sample surface, and describe a few important applications: (1) probing constant energy surfaces in k space by ballistic transport; (2) measuring scattering phase shifts of defects; (3) observing the transition from ballistic to diffusive transport to localization; and (4) measuring inelastic mean free paths. © 1995 The American Physical Society.
引用
收藏
页码:5502 / 5505
页数:4
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