INFLUENCE OF THE DEFECT CONCENTRATION ON THE RECOMBINATION IN ELECTRON BOMBARDED A-SI-GE-H ALLOYS STUDIED BY PHOTOLUMINESCENCE AND ELECTRON-SPIN RESONANCE

被引:2
作者
CARIUS, R [1 ]
FINGER, F [1 ]
机构
[1] UNIV MARBURG, FACHBEREICH PHYS, W-3550 MARBURG, GERMANY
关键词
D O I
10.1016/0022-3093(89)90646-7
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
收藏
页码:549 / 551
页数:3
相关论文
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