DIRECT MEASUREMENT OF THE SENSITIVITY DISTRIBUTION OF MAGNETORESISTIVE HEADS BY THE SXM TECHNIQUE

被引：12

作者：

SUEOKA, K

WAGO, K

SAI, F

机构：

[1] IBM Research, Tokyo Research Laboratory, Chiyoda-ku, Tokyo, 102, 5-19, Sanbancho

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1992年 / 28卷 / 05期

关键词：

D O I：

10.1109/20.179477

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The sensitivity distribution of a Magnetoresistive head was obtained by using a scanning probe microscope (SXM) technique. This technique allowed us to map with submicron resolution the sensitivity distribution on the air-bearing surface of the MR head in relation to the head structure. It was observed that the shape and location of the sensitivity distribution varied with changes in the sense current. Comparison with micro-track measurements showed qualitatively good agreements.

引用

页码：2307 / 2309

页数：3

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