EFFECT OF AI OVERLAYER THICKNESS ON THE LEAKAGE CURRENT OF RADIATION DETECTORS USING NB/AL-ALOX/NB SUPERCONDUCTING TUNNEL-JUNCTIONS

被引：5

作者：

MATSUMURA, A ^{[1
]}

TAKAHASHI, T ^{[1
]}

KURAKADO, M ^{[1
]}

机构：

[1] NIPPON STEEL CORP LTD,ADV TECHNOL RES LABS,KAWASAKI 211,JAPAN

来源：

JOURNAL OF APPLIED PHYSICS | 1994年 / 76卷 / 08期

关键词：

D O I：

10.1063/1.357246

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Nb/Al-AlOx/Nb superconducting tunnel junctions for the application of radiation detectors were fabricated using dc magnetron sputtering. The surface morphology of polycrystalline Nb films was observed using an atomic force microscope. Junctions with various Al film thicknesses were fabricated. The leakage current of the junctions is found to decrease as the Al thickness increases, indicating an improvement of the Al film coverage over the Nb surface. X rays were detected with the junctions prepared and the low leakage property across the junction makes possible x-ray detection with various size junctions up to 200 x 200 mum2.

引用

页码：4761 / 4765

页数：5

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