EFFECT OF NOISE ON THE PERFORMANCE OF RF SQUID MAGNETOMETERS

被引:9
作者
BRUNETBRUNOL, D
PASCAL, D
DURET, D
机构
[1] Institut d'Electronique Fondamentale, Laboratoire Associé Au C.N.R.S., Université de Paris Sud
关键词
D O I
10.1063/1.325645
中图分类号
O59 [应用物理学];
学科分类号
摘要
The various noise contributions of an rf SQUID have been studied. The importance of the noise figure of the rf amplifier has been pointed out by calculation and experiments, particularly by using a cooled GaAs FET preamplifier (noise temperature 25 K at 300 MHz) we have designed. The effects of noise upon the flux-locked loop characteristic have been investigated by introducing the notions of unlocking probability and of unlocking average time; the improvement of performances, especially of the slew rate of the flux-locked system by an increase of the modulation frequency, is limited by the noise.
引用
收藏
页码:521 / 529
页数:9
相关论文
共 14 条
[1]   DESIGN OF GAAS FIELD-EFFECT TRANSISTOR-AMPLIFIER COOLED TO VERY LOW-TEMPERATURE [J].
BRUNETBRUNOL, D .
REVUE DE PHYSIQUE APPLIQUEE, 1978, 13 (04) :180-187
[2]  
CHESNUT H, 1951, SERVOMECHANISMS REGU
[3]   SIMPLE, LOW-NOISE UHF SQUID MAGNETOMETER [J].
CLARK, TD ;
JACKEL, LD .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1975, 46 (09) :1249-1252
[4]  
DURET D, 1976, THESIS ORSAY
[5]   OPERATING CHARACTERISTICS OF THIN-FILM RF-BIASED SQUIDS [J].
FALCO, CM ;
PARKER, WH .
JOURNAL OF APPLIED PHYSICS, 1975, 46 (08) :3238-3243
[6]   Principles and Methods of Low-Frequency Electric and Magnetic Measurements Using an rf-Biased Point-Contact Superconducting Device [J].
Giffard, R. P. ;
Webb, R. A. ;
Wheatley, J. C. .
JOURNAL OF LOW TEMPERATURE PHYSICS, 1972, 6 (5-6) :533-610
[7]   SUPERCONDUCTING INSTRUMENT SYSTEMS [J].
GOODMAN, WL ;
HESTERMAN, VW ;
RORDEN, LH ;
GOREE, WS .
PROCEEDINGS OF THE IEEE, 1973, 61 (01) :20-27
[8]   NOISE IN RF SQUID [J].
JACKEL, LD ;
BUHRMAN, RA .
JOURNAL OF LOW TEMPERATURE PHYSICS, 1975, 19 (3-4) :201-246
[9]  
KURKIJARVI J, 1972, P APPL SUPERCONDUCTI
[10]   SUPERCONDUCTING MAGNETOMETERS [J].
MERCEREAU, JE .
REVUE DE PHYSIQUE APPLIQUEE, 1970, 5 (01) :13-+