DETERMINATION OF ELECTRIC-FIELD ENHANCEMENT FACTOR AND CRATER DIMENSIONS IN ALUMINUM FROM SCANNING ELECTRON MICROGRAPHS

被引：14

作者：

HACKAM, R ^{[1
]}

机构：

[1] UNIV SHEFFIELD,ELECTR & ELECT ENGN DEP,SHEFFIELD S1 3JD,ENGLAND

来源：

JOURNAL OF APPLIED PHYSICS | 1974年 / 45卷 / 01期

关键词：

D O I：

10.1063/1.1662944

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：114 / 118

页数：5

共 41 条

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