MEASUREMENT OF VERY HIGH RESISTIVITIES USING ELECTROOPTIC CRYSTALS

被引：2

作者：

MASSEY, GA

EROR, NG

NELSON, GW

机构：

来源：

APPLIED OPTICS | 1980年 / 19卷 / 08期

关键词：

D O I：

10.1364/AO.19.001282

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：1282 / 1284

页数：3

共 8 条

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[7] PRECISE AND RAPID MEASUREMENTS OF SMALL CURRENTS FROM HIGH IMPEDANCE SOURCES [J].

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[8]

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