HIGHLY STABLE SINGLE-CRYSTAL LAB6 CATHODE FOR CONVENTIONAL ELECTRON-MICROPROBE INSTRUMENTS

被引：18

作者：

SHIMIZU, R

SHINIKE, T

ICHIMURA, S

KAWAII, S

TANAKA, T

机构：

[1] OSAKA UNIV,FAC ENGN,DEPT APPL PHYS,SUITA,OSAKA 565,JAPAN

[2] NATL INST RES INORGAN MAT,NIIHARI,IBARAKI 30031,JAPAN

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1978年 / 15卷 / 03期

关键词：

D O I：

10.1116/1.569676

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：922 / 926

页数：5

共 23 条

[1] LANTHANUM HEXABORIDE ELECTRON EMITTER [J].

AHMED, H ;

BROERS, AN .

JOURNAL OF APPLIED PHYSICS, 1972, 43 (05) :2185-&

[2] OPTIMIZATION OF PERFORMANCE OF HIGH-BRIGHTNESS ELECTRON GUNS [J].

AHMED, H ;

MUNRO, E .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1973, 10 (06) :972-974

[3] A NEW HIGH RESOLUTION REFLECTION SCANNING ELECTRON MICROSCOPE [J].

BROERS, AN .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1969, 40 (08) :1040-&

[4] NEW HIGH-RESOLUTION ELECTRON-PROBE [J].

BROERS, AN .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1973, 10 (06) :979-982

[5]

FERRIS SD, 1975, 8TH ANN S

[6] PREPARATION OF SINGLE-CRYSTAL LAB6 CATHODES FOR ELECTRON-MICROSCOPES [J].

GIBSON, ED ;

VERHOEVEN, JD .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1975, 8 (12) :1003-1004

[7]

HAINE ME, 1961, ELECTRON MICROSCOPY

[8]

HOSOKI S, 1974, JAPAN J APPL PHYS S, V2, P285

[9]

Joy D. C., 1974, Scanning Electron Microscopy 1974, P327

[10] BORIDE CATHODES [J].

LAFFERTY, JM .

JOURNAL OF APPLIED PHYSICS, 1951, 22 (03) :299-309

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