INVESTIGATION OF CHEMICAL MICRO-INHOMOGENEITIES IN BI100-XSBX SINGLE-CRYSTALS

Double‐crystal topography, electron‐beam microanalysis, and electrolytical etching are used for characterizing the micro‐inhomogeneities of the antimony concentration in zone‐levelled Bi100–xSbx single crystals. The double‐crystal topography detects the micro‐inhomogeneities by means of lattice‐constant variations, whereas the electron‐beam microanalysis utilizes the intensity variation of the characteristic X‐radiation. All the methods employed yield a periodic striated structure, being in good agreement with each other. The striation distances vary from 1 to 400 μm, the detected variation amplitudes ranging within 0.05 ≦ Δx ≦ 0.25. The detected micro‐inhomogeneities can be attributed to different growth‐conditioned causes. Copyright © 1979 WILEY‐VCH Verlag GmbH & Co. KGaA