ELECTRON MICRO-PROBE ANALYSIS OF THE DISTRIBUTION OF SILICON IN THE LEAVES OF SELAGINELLA-EMMELIANA

被引：14

作者：

DENGLER, NG ^{[1
]}

LIN, EYC ^{[1
]}

机构：

[1] ROYAL ONTARIO MUSEUM,ANALYT SYST LAB,TORONTO M5S 2C6,ONTARIO,CANADA

来源：

CANADIAN JOURNAL OF BOTANY-REVUE CANADIENNE DE BOTANIQUE | 1980年 / 58卷 / 23期

关键词：

D O I：

10.1139/b80-286

中图分类号：

Q94 [植物学];

学科分类号：

071001 ;

摘要：

引用

收藏

页码：2459 / 2466

页数：8

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