CRYSTALLOGRAPHIC CONTRIBUTION TO THE FORMATION OF COLUMNAR GRAIN-STRUCTURE IN IRON FILMS DEPOSITED AT OBLIQUE-INCIDENCE

被引：3

作者：

OKAMOTO, K

HASHIMOTO, T

ITOH, K

HARA, K

KAMIYA, M

FUJIWARA, H

机构：

[1] KUMAMOTO UNIV,FAC GEN EDUC,DEPT PHYS,KUMAMOTO 860,JAPAN

[2] CHIBA UNIV,FAC EDUC,CHIBA 263,JAPAN

[3] TOTTORI UNIV,FAC EDUC,TOTTORI 680,JAPAN

[4] HIROSHIMA JOGAKUIN UNIV,FAC LITERATURE,HIROSHIMA 732,JAPAN

来源：

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 1995年 / 148卷 / 1-2期

关键词：

D O I：

10.1016/0304-8853(95)00132-8

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The columnar grain structure and the texture were investigated for Fe films vapor-deposited at various deposition rates Ii. The incidence angle was 65 degrees and the substrate temperature was 473 K. From the X-ray analysis using the Schulz method and the observations of replica electron microscopy it was revealed that the change in columnar grain structure with R can be understood by considering the exhibition of the {100} habit.

引用

页码：21 / 22

页数：2

共 3 条

[1] COMPOSITIONAL DEPENDENCE OF THE COLUMNAR GRAIN-STRUCTURE IN OBLIQUELY DEPOSITED FE1-X-COX (X=0-1) FILMS
HASHIMOTO, T
OKAMOTO, K
FUJIWARA, H
ITOH, K
KAMIYA, M
HARA, K
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1992, 31 (08): : 2554 - 2559
[2] COLUMNAR STRUCTURE AND TEXTURE OF IRON FILMS PREPARED AT VARIOUS EVAPORATION RATES
OKAMOTO, K
HASHIMOTO, T
HARA, K
KAMIYA, M
FUJIWARA, H
[J]. THIN SOLID FILMS, 1987, 147 (03) : 299 - 311
[3] A DIRECT METHOD OF DETERMINING PREFERRED ORIENTATION OF A FLAT REFLECTION SAMPLE USING A GEIGER COUNTER X-RAY SPECTROMETER
SCHULZ, LG
[J]. JOURNAL OF APPLIED PHYSICS, 1949, 20 (11) : 1030 - 1032

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