KINETIC ELECTRON-EMISSION YIELD INDUCED BY H+ AND HE2+ IONS VERSUS STOPPING POWER FOR AL, CU, AG AND AU

被引:19
作者
BENKA, O
STEINBAUER, E
BAUER, P
机构
[1] Institut für Experimentalphysik, Universität Linz
关键词
D O I
10.1016/0168-583X(94)95513-1
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
For H+ and He2+ ions impinging on Al, Cu, Ag and Au targets we measured simultaneously the yield, gamma, of emitted electrons and the electronic energy loss, S(e), in the energy range 0.5 to 4.8 MeV. The targets were prepared under high-vacuum conditions before they were transferred to an ultra-high-vacuum chamber without breaking the vacuum. The targets were sputter cleaned and their composition was examined by Auger electron spectrometry. The values of gamma were obtained by current integration and S(e) was determined from the energy width of Rutherford backscattering spectra. For H+ ions impinging on Cu, Ag or Au and He2+ on Al and Cu, the expected proportionality between gamma and S(e) was found within the experimental errors of 2%. For H+ ions on Al and He2+ ions on Ag and Au targets, significant deviations were observed.
引用
收藏
页码:64 / 66
页数:3
相关论文
共 9 条
[1]   EXPERIMENTAL INVESTIGATION OF THE Z2 SCALING LAW OF FAST-ION-PRODUCED SECONDARY-ELECTRON EMISSION [J].
BOROVSKY, JE ;
SUSZCYNSKY, DM .
PHYSICAL REVIEW A, 1991, 43 (03) :1416-1432
[2]   ION INDUCED ELECTRON-EMISSION FROM METAL-SURFACES [J].
HASSELKAMP, D ;
LANG, KG ;
SCHARMANN, A ;
STILLER, N .
NUCLEAR INSTRUMENTS & METHODS, 1981, 180 (2-3) :349-356
[3]  
Hasselkamp D., 1992, PARTICLE INDUCED ELE
[4]   REFERENCE STOPPING CROSS-SECTIONS FOR HYDROGEN AND HELIUM-IONS IN SELECTED ELEMENTS [J].
PAUL, H ;
SEMRAD, D ;
SEILINGER, A .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1991, 61 (03) :261-281
[5]   SECONDARY-ELECTRON YIELDS FROM THIN FOIL - A POSSIBLE PROBE FOR THE ELECTRONIC STOPPING POWER OF HEAVY-IONS [J].
ROTHARD, H ;
KRONEBERGER, K ;
CLOUVAS, A ;
VEJE, E ;
LORENZEN, P ;
KELLER, N ;
KEMMLER, J ;
MECKBACH, W ;
GROENEVELD, KO .
PHYSICAL REVIEW A, 1990, 41 (05) :2521-2535
[6]  
ROTHARD H, 1992, PARTICLE INDUCED ELE
[7]  
SCHOU J, 1988, SCANNING MICROSCOPY, V2, P607
[8]   THEORY OF SECONDARY ELECTRON EMISSION BY HIGH-SPEED IONS [J].
STERNGLASS, EJ .
PHYSICAL REVIEW, 1957, 108 (01) :1-12
[9]  
Ziegler J., 1985, STOPPING RANGES IONS