A FINITE-DIFFERENCE PROCEDURE FOR THE EXTERIOR PROBLEM INHERENT IN CAPACITANCE COMPUTATIONS FOR VLSI INTERCONNECTIONS

被引：18

作者：

ZEMANIAN, AH ^{[1
]}

机构：

[1] STANFORD UNIV, FOOD RES INST, STANFORD, CA 94305 USA

来源：

关键词：

D O I：

10.1109/16.3355

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：985 / 992

页数：8

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