ELECTRONIC-PROPERTIES OF ULTRATHIN NICKEL FILMS ON W(110)

被引：48

作者：

KOZIOL, C ^{[1
]}

LILIENKAMP, G ^{[1
]}

BAUER, E ^{[1
]}

机构：

[1] TECH UNIV CLAUSTHAL,INST PHYS,W-3392 CLAUSTHAL ZELLERFE,GERMANY

来源：

PHYSICAL REVIEW B | 1990年 / 41卷 / 06期

关键词：

D O I：

10.1103/PhysRevB.41.3364

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Ultrathin films of nickel on W(110) are investigated by angularly resolved photoelectron spectroscopy. Quantitative information about the first stages of epitaxial growth is extracted from this data, as well as from reflection high-energy electron diffraction, low-energy electron-diffraction oscillations, and Auger-electron spectroscopy. The band structure of this quasi-two- dimensional system is mapped out and the influence of the geometric film structure and of the interaction with the substrate on the electronic structure is discussed. © 1990 The American Physical Society.

引用

页码：3364 / 3371

页数：8

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