ELECTRICAL-PROPERTIES OF SN CONTACTS WITH CLEAVED OXIDE SUPERCONDUCTOR FILMS

被引:7
作者
TAKEUCHI, I
TSAI, JS
TSUGE, H
MATSUKURA, N
MIURA, S
YOSHITAKE, T
KOJIMA, Y
MATSUI, S
机构
[1] Fundamental Research Laboratories, NEC Corporation, Tsukuba, Ibaraki 305
关键词
D O I
10.1109/20.133497
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have studied the feasibility of making sharp and clean electrical contacts with high temperature superconductors by cleaving single crystal Y-Ba-Cu-O and Bi-Sr-Ca-Cu-O films in the stream of evaporated noble metals forming SN contacts at the revealed cross-sectional edge surfaces of the films. With this technique, we have consistently obtained contact resistances in the order of 10(-9) to 10(-8) OMEGA-cm2. From a structure with an oxide/Au/oxide configuration, the interface resistance was found to show a flat temperature dependence below T(c). Material dependence and anisotropy were observed in the contact resistance.
引用
收藏
页码:1626 / 1629
页数:4
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