DETERMINATION OF STRUCTURE POTENTIALS AND ABSORPTION POTENTIALS OF SILICON FROM ELECTRON DIFFRACTION INTENSITIES

被引：12

作者：

KREUTLE, M

MEYEREHM.G

机构：

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1971年 / 8卷 / 01期

关键词：

D O I：

10.1002/pssa.2210080110

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：111 / &

共 29 条

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[4] DETERMINATION OF STRUCTURE FACTORS FROM DYNAMICAL EFFECTS IN ELECTRON DIFFRACTION
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[J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1967, 298 (1455): : 395 - &
[6] COVALENT BOND IN SILICON
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[7] COVALENT BOND IN DIAMOND
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[J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1967, 298 (1454): : 264 - &
[8] A GENERAL STRUCTURE FACTOR FORMALISM FOR INTERPRETING ACCURATE X-RAY AND NEUTRON DIFFRACTION DATA
DAWSON, B
[J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1967, 298 (1454): : 255 - &
[9] X-RAY STUDIES OF COVALENT BONDING IN DIAMOND AND SILICON
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[J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1967, 301 (1465): : 195 - &
[10] DEMARCO JJ, 1965, PHYS REV A, V137, P1896

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