GROWTH OF FCC FE FILMS ON DIAMOND

被引：16

作者：

PAPPAS, DP

GLESENER, JW

HARRIS, VG

IDZERDA, YU

KREBS, JJ

PRINZ, GA

机构：

[1] Naval Research Laboratory, Washington

来源：

APPLIED PHYSICS LETTERS | 1994年 / 64卷 / 01期

关键词：

D O I：

10.1063/1.110910

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The epitaxial growth of fcc iron films on the (001) face of diamond has been achieved. The films were studied by reflection high-energy electron diffraction and angle-resolved Auger electron diffraction. The studies show that 4-5 atomic layers of Fe on C(100) form a continuous film. The films as deposited at room temperature are disordered, and after a high-temperature anneal have a fcc structure at room temperature.

引用

收藏

页码：28 / 30

页数：3

相关论文

共 16 条

[1] ELASTIC-SCATTERING AND INTERFERENCE OF BACKSCATTERED PRIMARY, AUGER AND X-RAY PHOTOELECTRONS AT HIGH KINETIC-ENERGY - PRINCIPLES AND APPLICATIONS [J].

CHAMBERS, SA .

SURFACE SCIENCE REPORTS, 1992, 16 (06) :261-331

[2]

CLARKE A, 1987, SURF SCI, V192, pL843, DOI 10.1016/S0039-6028(87)81155-X

[3] LEED STUDY OF FE EPITAXIALLY GROWN AT 190-DEGREES-C ON CU(100) [J].

DARICI, Y ;

MARCANO, J ;

MIN, H ;

MONTANO, PA .

SURFACE SCIENCE, 1989, 217 (03) :521-528

[4] DISPLACIVE PHASE-TRANSITION AND SURFACE-PHONON ANOMALIES IN FCC FE FILMS ON CU(100) [J].

DAUM, W ;

STUHLMANN, C ;

IBACH, H .

PHYSICAL REVIEW LETTERS, 1988, 60 (26) :2741-2744

[5] X-RAY PHOTOELECTRON AND AUGER-ELECTRON FORWARD SCATTERING - A NEW TOOL FOR SURFACE CRYSTALLOGRAPHY [J].

EGELHOFF, WF .

CRITICAL REVIEWS IN SOLID STATE AND MATERIALS SCIENCES, 1990, 16 (03) :213-235

[6] ANGLE-RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY [J].

FADLEY, CS .

PROGRESS IN SURFACE SCIENCE, 1984, 16 (03) :275-388

[7]

FADLEY CS, 1990, SYNCHROTRON RAD RES

[8] SURFACE, INTERFACE, AND THIN-FILM MAGNETISM [J].

FALICOV, LM ;

PIERCE, DT ;

BADER, SD ;

GRONSKY, R ;

HATHAWAY, KB ;

HOPSTER, HJ ;

LAMBETH, DN ;

PARKIN, SSP ;

PRINZ, G ;

SALAMON, M ;

SCHULLER, IK ;

VICTORA, RH .

JOURNAL OF MATERIALS RESEARCH, 1990, 5 (06) :1299-1340

[9] AUGER-ELECTRON AND PHOTOELECTRON ANGULAR-DISTRIBUTIONS FROM SURFACES - IMPORTANCE OF THE ELECTRON SOURCE WAVE [J].

GREBER, T ;

OSTERWALDER, J ;

NAUMOVIC, D ;

STUCK, A ;

HUFNER, S ;

SCHLAPBACH, L .

PHYSICAL REVIEW LETTERS, 1992, 69 (13) :1947-1950

[10] STRUCTURAL EFFECTS IN SINGLE-CRYSTAL PHOTOELECTRON, AUGER-ELECTRON, AND KIKUCHI-ELECTRON ANGULAR DIFFRACTION PATTERNS [J].

HAN, ZL ;

HARDCASTLE, S ;

HARP, GR ;

LI, H ;

WANG, XD ;

ZHANG, J ;

TONNER, BP .

SURFACE SCIENCE, 1991, 258 (1-3) :313-327