GEOMETRICAL SIZE EFFECT IN RESISTIVITY AND HALL COEFFICIENT IN SINGLE-CRYSTAL SILVER FILMS

被引：15

作者：

DUGGAL, VP

NAGPAL, VP

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1971年 / 42卷 / 11期

关键词：

D O I：

10.1063/1.1659801

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：4500 / &

共 16 条

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[5]

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[6] SIZE EFFECT IN THIN SINGLE-CRYSTAL SILVER FILMS [J].

DUGGAL, VP ;

NAGPAL, VP .

APPLIED PHYSICS LETTERS, 1968, 13 (06) :206-&

[7]

HERMANN W, 1965, Z NATURFORSCH PT A, VA 20, P1050

[8] HALL COEFFICIENT IN EVAPORATED GOLD FILMS [J].

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[9] ELECTRICAL RESISTIVITY OF THIN EPITAXIALLY GROWN SILVER FILMS ( RESISTIVITY RATIOS 17 TO 175 WITH FILM THICKNESS 640 TO 13000 A E/T ) [J].

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[10]

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