MICRO-ANALYSIS BY A FLYING-SPOT X-RAY METHOD

[1] SUR LES BASES PHYSIQUES DE LANALYSE PONCTUELLE PAR SPECTROGRAPHIE-X [J]. JOURNAL DE PHYSIQUE ET LE RADIUM, 1955, 16 (04): : 304 - 317

[2] THE X-RAY SHADOW MICROSCOPE [J]. JOURNAL OF APPLIED PHYSICS, 1953, 24 (05) : 616 - 623

[3] AN IMPROVED SCANNING ELECTRON MICROSCOPE FOR OPAQUE SPECIMENS [J]. PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1953, 100 (75): : 245 - 259

[4] HIGH-RESOLUTION X-RAY PROJECTION MICROSCOPY [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1955, 232 (1191): : 475 - &

[5] PATTEE HH, 1953, J OPT SOC AM, V43, P61

[6] THE SCANNING ELECTRON MICROSCOPE AND ITS FIELDS OF APPLICATION [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1955, 6 (11): : 391 - 399

[1] SUR LES BASES PHYSIQUES DE LANALYSE PONCTUELLE PAR SPECTROGRAPHIE-X [J]. JOURNAL DE PHYSIQUE ET LE RADIUM, 1955, 16 (04): : 304 - 317

[2] THE X-RAY SHADOW MICROSCOPE [J]. JOURNAL OF APPLIED PHYSICS, 1953, 24 (05) : 616 - 623

[3] AN IMPROVED SCANNING ELECTRON MICROSCOPE FOR OPAQUE SPECIMENS [J]. PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1953, 100 (75): : 245 - 259

[4] HIGH-RESOLUTION X-RAY PROJECTION MICROSCOPY [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1955, 232 (1191): : 475 - &

[5] PATTEE HH, 1953, J OPT SOC AM, V43, P61

[6] THE SCANNING ELECTRON MICROSCOPE AND ITS FIELDS OF APPLICATION [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1955, 6 (11): : 391 - 399