LIFE-TIME-MEASUREMENT OF COULOMB-EXCITED LEVELS BY A PULSED-BEAM-TECHNIQUE

被引:25
作者
RICHTER, FW
SCHUTT, J
WIEGANDT, D
机构
来源
ZEITSCHRIFT FUR PHYSIK | 1968年 / 213卷 / 02期
关键词
D O I
10.1007/BF01379826
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The half-life of the first excited states of150Nd,152Sm,154Sm,160Gd and170Er have been measured by pulsed beam-technique. Using the slope-method and a momentumanalysis we get the following results:150Nd 131 keV-level T1/2=(1.48±0.04) ns152Sm 122 keV-level T1/2=(1.44±0.03) ns154Sm 82 keV-level T1/2=(3.00±0.06) ns160Gd 75 keV-level T1/2=(2.68±0.06) ns170Er 79 keV-level T1/2=(1.88±0.05) ns © 1968 Springer-Verlag.
引用
收藏
页码:202 / &
相关论文
共 17 条