IMPROVED EXTENDED-X-RAY-ABSORPTION FINE-STRUCTURE (EXAFS) STUDIES APPLIED TO INVESTIGATION OF CU-O, CU-N, AND CU-BR BOND LENGTHS

被引：118

作者：

MARTENS, G

RABE, P

SCHWENTNER, N

WERNER, A

机构：

来源：

PHYSICAL REVIEW B | 1978年 / 17卷 / 04期

关键词：

D O I：

10.1103/PhysRevB.17.1481

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：1481 / 1488

页数：8

共 23 条

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