DARK DECAY OF SURFACE-POTENTIAL - MEASUREMENT OF THE DENSITY OF LOCALIZED STATES IN HIGHLY RESISTIVE AMORPHOUS-SILICON ALLOYS

被引:3
作者
NAKAYAMA, Y
KITA, H
TAKAHASHI, T
AKITA, S
KAWAMURA, T
机构
关键词
D O I
10.1016/0022-3093(87)90175-X
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
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页码:743 / 746
页数:4
相关论文
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PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1985, 51 (04) :405-420
[2]  
NAKAYAMA Y, 1986, SOC J ELECTROPHOTOGR, V25, P135