INFRA-RED FARADAY ROTATION IN SEMICONDUCTORS - DOUBLE BEAM PHASE-SENSITIVE METHOD FOR MEASUREMENT OF INFRA-RED FARADAY ROTATION ELLIPTICITY + VOIGT EFFECT

被引：22

作者：

PIDGEON, CR

SMITH, SD

机构：

来源：

INFRARED PHYSICS | 1964年 / 4卷 / 01期

关键词：

D O I：

10.1016/0020-0891(64)90040-5

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：13 / &

共 29 条

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