ANOMALOUS SURFACE REFLECTION OF X RAYS

[1] X-ray wave-lengths by the dispersion in quartz [J]. PHYSICAL REVIEW, 1932, 39 (01): : 1 - 7

[2] APPARENT DENSITY OF THIN EVAPORATED FILMS [J]. JOURNAL OF APPLIED PHYSICS, 1954, 25 (03) : 338 - 340

[3] GROTH R, 1959, ANN PHYS, V2, P380

[4] UBER EINE VEREINFACHUNG DER PRISMENMETHODE ZUR BESTIMMUNG DES BRECHUNGSINDEX FUR RONTGENLICHT [J]. NATURWISSENSCHAFTEN, 1958, 45 (05) : 107 - 109

[5] Kiessig H, 1931, ANN PHYS-BERLIN, V10, P769

[6] Interference of x-rays on thin layers. [J]. NATURWISSENSCHAFTEN, 1930, 18 : 847 - 848

[7] SIEGBAHN M, 1925, K PHYSIQUE, V6, P228

[8] DENSITY MEASUREMENTS OF SOME THIN COPPER FILMS [J]. JOURNAL OF APPLIED PHYSICS, 1959, 30 (10) : 1604 - 1609

[1] X-ray wave-lengths by the dispersion in quartz [J]. PHYSICAL REVIEW, 1932, 39 (01): : 1 - 7

[2] APPARENT DENSITY OF THIN EVAPORATED FILMS [J]. JOURNAL OF APPLIED PHYSICS, 1954, 25 (03) : 338 - 340

[3] GROTH R, 1959, ANN PHYS, V2, P380

[4] UBER EINE VEREINFACHUNG DER PRISMENMETHODE ZUR BESTIMMUNG DES BRECHUNGSINDEX FUR RONTGENLICHT [J]. NATURWISSENSCHAFTEN, 1958, 45 (05) : 107 - 109

[5] Kiessig H, 1931, ANN PHYS-BERLIN, V10, P769

[6] Interference of x-rays on thin layers. [J]. NATURWISSENSCHAFTEN, 1930, 18 : 847 - 848

[7] SIEGBAHN M, 1925, K PHYSIQUE, V6, P228

[8] DENSITY MEASUREMENTS OF SOME THIN COPPER FILMS [J]. JOURNAL OF APPLIED PHYSICS, 1959, 30 (10) : 1604 - 1609