SOME BASIC LOGIC CIRCUITS EMPLOYING GUNNEFFECT DEVICES

被引：7

作者：

HARTNAGEL, H

机构：

来源：

关键词：

D O I：

10.1016/0038-1101(68)90097-X

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：568 / +

页数：1

共 4 条

[1] LOGIC AND MEMORY ELEMENTS USING 2-VALLEY SEMICONDUCTORS [J].

COPELAND, JA ;

HAYASHI, T ;

UENOHARA, M .

PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1967, 55 (04) :584-&

[2] DIGITAL LOGIC-CIRCUIT APPLICATIONS OF GUNN DIODES [J].

HARTNAGEL, HL .

PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1967, 55 (07) :1236-+

[3] EXPERIMENTAL VERIFICATION OF GUNN-EFFECT COMPARATOR [J].

IZADPANAH, SH ;

HARTNAGE.HL .

PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1967, 55 (10) :1748-+

SANDBANK, CP .